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MOS Interface Physics, Process and Characterization

MOS Interface Physics, Process and Characterization

SKU:9781032106281

CRC Press

The electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important component of a large-scale integrated circuit and the key to achieving high performance devices. This book contains experimental examples focusing on MOS and will be a reference for academics and postgraduates in the field of microelectronics.

Copyright Year: 2022

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