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Applying the Rasch Model and Structural Equation Modeling to Higher Education: The Technology Satisfaction Model
Applying the Rasch Model and Structural Equation Modeling to Higher Education: The Technology Satisfaction Model
SKU:9781032471402
Chapman and Hall/CRC
This book introduces the fundamentals of the technology satisfaction model (TSM), supporting readers in applying the Rasch model and Structural Equation Modelling (SEM) – a multivariate technique - to higher education (HE) research. User satisfaction is traditionally measured along a single dimension.
Copyright Year: 2023
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